Title: MICRO-TOMOGRAPHY BASED ANALYSIS OF THERMAL PROTECTION SYSTEM MATERIALS - OVERVIEW
Authors: Samantha R Bernstein, Colin Yee, Steven Kim, Kaelyn Wagner, Dula Parkinson, Joseph H. Koo
Abstract: The microstructures of thermal protection systems (TPS) materials were characterized using the Lawrence Berkeley National Laboratory (LBNL)’s Beamline 8.3.2 at the Advanced Light Source (ALS). The Synchrotron-based Hard X-ray Micro-Tomography instrument allowed for non-destructive 3-Dimensional imaging of 72 different samples of TPS materials. The tomography voxels were used to reconstruct images using the rendering software Dragonfly. These images are examined and compared to create new learnings about the microstructure differences between different thermal protection materials. Challenges associated with the preparation of samples, the use of this technique, computational requirements, and the limitations of the rendered images are also discussed. Future work includes the analysis of material properties, such as tortuosity, thermal and electrical conductivity, and porosity using NASA’s Porous Microstructure Analysis (PuMA) software. Additionally, machine learning methods are being applied to investigate and quantify the microstructural characteristics that lead to the optimal ablative performance
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Conference: SAMPE 2023
Publication Date: 2023/04/17
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